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 Complementary analysis
Boolean searching, chemical restraints, automated unit-cell refinement,
space group, systematic hkl
extinctions, efficient background subtraction and advanced Kα2 stripping, polynomial spline data
interpolation, Fourier
and functional filtering, FWHM,
integrated width, asymmetry, crystal size and strain (Williamson-Hall,
Warren-Averbach and Log-Normal distribution).
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Graphic capability
Includes recording in BMP
image files, high quality HPGL
files, copies to the clipboard and impression of up to fifty diagrams
simultaneously. Thermodiffraction and mapping (New).
The XPowder PLUS version also allows to full duplex control of PW1710/00
and PW3710 diffractometers.
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