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XPowder features
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| General |
| Import/export several data
formats (Bruker Raw, Philips RD, UDF, Xpert, Cerius GRF, x-y, PLV, etc.). |
| Automatic background subtraction. |
| Data smoothing (Functional or Fourier filtering). |
| Data spline interpolation. |
| Advanced and classic (Rachinger) Ka2-stripping. |
| 2q-offset and sample displacement corrections with internal standard
or harmonic methods |
| Undo / redo / reload. |
| Copy/paste and export graphic files (BMP, HPGL). Printing. |
| Text reports. Echo log file. |
| Addition, subtraction and merging of diffractograms. |
| Lineal/Logarithmic intensity scale. |
| Switch automatic divergence slit to fixed divergence slit . |
| Automatic or manual peak search and tables. |
| Interactive 3D
and 2D (mapping) presentation (up to 50 scans simultaneously).
Thermodifraction. |
| Zoom, colours, pen size and other graphic capabilities. |
| PW1710/00 diffractometer full-duplex control (Only the PLUS version). |
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| Qualitative |
| Automatic and search/match phase identification in combination with the ICDD Powder Diffraction File (PDF2). |
| Display stick, hkl-indices and information for PDF patterns. |
| Boolean searching [(Name (And, And, And) + Chemical (And, Or, Not] + PDF sub-files + deleted patterns). |
| Automatic refinement and graphical adjustment of lattice parameters. |
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| Quantitative |
| The determination of amounts of different phases in multi-phase samples is automatically accomplished by LS pattern-fitting in experimental standard patterns and observed X-ray scattering. Intensities are fitted including some fitting parameters, i.e. peak position and absorption correction. |
| Only in the XPowder professional versions: The determination of amounts of different phases in multi-phase samples is automatically accomplished by LS pattern-fitting in PDF2 standard patterns and observed X-ray scattering by Normalized RIR Methods. Intensities are fitted including some fitting parameters, i.e. peak position, profile broadening (Pseudo Voigt model versus experimental Form Factors) and absorption correction. The results are shows automatically on the graphic screen. Parameter fitting are not request as starting point. The accuracy of the results depending mainly of the PDF2 patter quality achieved in the
searching. Innovative global amorphous stuff. |
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| Profile |
| Calculation of profile parameters such as FWMH, Form Factor, Asymmetry, X-Size and strain (Williamson-Hall and Warren-Averbach),Log-Normall crystal size distribution, integral Counts, instrumental broadening correction, etc.. |
| Phase profile extraction (LS methods). |
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