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Diffractometer setting - (12/02/2006)

Amorphous compounds quantification - (20/12/2005)

New data formats: X_Pert and Raw - (28/11/2005)

Scanning profiles - (24/10/2005)

Crystal size and strain (June,21th,05) - (21/06/2005)

K-alpha2 stripping (June,20th,2005) - (20/06/2005)

Mapping and thermodiffraction (06/20th/2006)



Amorphous compounds quantification

December 20th , 2005. IMPORTANT: Do not remove the background of diffractograms in order to quantify amorphous compounds and crystalline phases in mixtures (from PDF2 cards by Normalized RIR Method – Chung,1974- or from experimental patterns). The advisable 0.17 RIR value is appropriate to quantify amorphous in most of cases. Anyway, this value must be forever fitted for each diffractometer and each composition (it is affected mainly by the absorption mass coefficient). The current update.zip file is critical in order to carry out accurately this quantitative analysis. Otherwise, the background must be always previously removed in studies of profile, size, strain, etc

Date:20/12/2005


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