What's new

- Click on title to enlarge information

Diffractometer setting - (12/02/2006)

Amorphous compounds quantification - (20/12/2005)

New data formats: X_Pert and Raw - (28/11/2005)

Scanning profiles - (24/10/2005)

Crystal size and strain (June,21th,05) - (21/06/2005)

K-alpha2 stripping (June,20th,2005) - (20/06/2005)

Mapping and thermodiffraction (06/20th/2006)

New data formats: X_Pert and Raw

There are been including the data format xml (* xrdml) of X_Pert and other Raw not contemplated previously . The method of heavy has been optimized of data in quantitative analisis based on cards PDF2.

Date:28/11/2005